Career details 4/5 2000 – 2017｜Inspec (Board Director & CTO, IPO)
Top domestic and global shares in visual inspection systems
Every product developed from scratch—handling optical design, electronic circuit design, the CTO role, and overseas support, and guiding the company to IPO as board director & CTO. Achieved the top global share with TAB tape inspection systems (AOI).
Key products and achievements
- Top domestic share in lead-frame inspection systems — 2002
- Delivered the world's most sensitive G6/G8 LCD TFT pattern inspection systems, capable of inspecting peripheral circuitry as well — 2005
- Top global share in TAB tape inspection systems (AOI) for LCD driving — 2006
- Developed a PCB pattern-inspection system (AOI) supporting the world's smallest line width (2μm) — 2012
- Obtained Intel equipment certification for visual inspection (AVI) and pattern inspection of cutting-edge MPUs — 2013
- Developed the industry's fastest roll-to-roll flexible-substrate pattern inspection system — 2017
Expertise accumulated in this era
- Development of large-scale hardware image-processing systems — 30+ years, 7 generations in total
- High-sensitivity, low-false-positive visual inspection algorithms
- Optical sensing: imaging, illumination, white-light interferometry, LED illumination development, camera and lens evaluation
- Ultra-high-resolution pattern inspection via sub-pixel metrology — 10+ years
- AI-based automatic classification of detected defects